KETEK GmbH
About
KETEK GmbH, headquartered at Hofer Str. 3 in Munich, Germany, is a manufacturer of silicon drift detectors (SDDs) and X-ray spectroscopy systems. Founded in 1989 by Dr. Josef Kemmer, who pioneered SDD technology, the company develops and produces its detectors entirely in-house—from bare silicon wafers through detector chips to complete modules and electronics. KETEK's VITUS series SDD modules range from the compact H7 (7 mm² collimated area) to the large-area H150 (143 mm²), achieving energy resolution of ≤129 eV at Mn-Kα for smaller detectors and ≤136 eV for larger models. The company set a world-record 120.9 eV energy resolution for SDDs in 2010. In 2025, KETEK introduced the VITUS H20 SLF, a stray-line-free detector design that eliminates unwanted X-ray excitation. Window options include the CH graphene window (1 µm, replacing traditional beryllium) and CL low-energy graphene window (165 nm, 86% open area). Complete spectroscopic systems include the AXAS-D 3.0 with DPP3 digital pulse processor, VICO-DV 3.0 OEM electronics, VIAMP-KP/KC 3.0 compact detector modules, and ARRAY 3.0 multi-channel systems providing up to 350 mm² total collimated area across 3–7 channels. KETEK SDDs were deployed on NASA's Curiosity (2012) and Perseverance (2021) Mars rovers for planetary XRF analysis. The company is ISO 9001:2015 certified by TÜV Management Services.
Key Products
Silicon drift detectors in sizes from 7mm² to 150mm² for XRF and EDS spectroscopy, providing high-resolution X-ray detection.
Complete detector system with DPP3 digital pulse processor for XRF analysis, integrating SDD, preamplifier, and digital signal processing.
Highly integrated OEM electronics boards for integration into customer spectrometer and analytical instrument systems.
Compact SDD and preamplifier combinations for XRF and EDS applications requiring minimal footprint.
Multi-detector XRF system with 3–7 SDD channels providing up to 350mm² total collimated area for high-throughput analysis.
1µm graphene window replacing traditional beryllium for soft X-ray detection with improved safety and performance.
165nm low-energy graphene window with 86% open area for enhanced light element detection in XRF spectroscopy.
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